Invention Application
- Patent Title: SLIDING RAIL TYPE PROBE
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Application No.: US15439967Application Date: 2017-02-23
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Publication No.: US20180074095A1Publication Date: 2018-03-15
- Inventor: Chih-Peng HSIEH
- Applicant: CHUNGHWA PRECISION TEST TECH. CO., LTD.
- Priority: TW105129631 20160912
- Main IPC: G01R1/067
- IPC: G01R1/067 ; G01R31/28

Abstract:
A probe having a sliding rail is provided and includes a probe head, a probe tail, an elastic element made of an elastic material and connected between the probe head and the probe tail, and a sliding rail assembly. The sliding rail assembly includes a slide rail and a position limit protrusion. The slide rail has a fixed end and a free end. The fixed end is fixedly connected to the probe tail, and the free end extends to the probe head. The position limit protrusion is fixedly connected to the probe head, and has a sliding slot formed thereon through which the slide rail can pass. The sliding rail assembly is made of a conductive material, and a cross-section area of the slide rail is greater than a cross-section area of the elastic material of the elastic element.
Public/Granted literature
- US09970960B2 Sliding rail type probe Public/Granted day:2018-05-15
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