公开(公告)号：US20180074095A1

公开(公告)日：2018-03-15

申请号：US15439967

申请日：2017-02-23

Applicant: CHUNGHWA PRECISION TEST TECH. CO., LTD.

Inventor： Chih-Peng HSIEH

IPC: G01R1/067 ,  G01R31/28

CPC classification number: G01R1/06794 ,  G01N1/00 ,  G01N2201/00 ,  G01R1/06722 ,  G01R1/44 ,  G01R31/2831 ,  H01L2221/00

Abstract: A probe having a sliding rail is provided and includes a probe head, a probe tail, an elastic element made of an elastic material and connected between the probe head and the probe tail, and a sliding rail assembly. The sliding rail assembly includes a slide rail and a position limit protrusion. The slide rail has a fixed end and a free end. The fixed end is fixedly connected to the probe tail, and the free end extends to the probe head. The position limit protrusion is fixedly connected to the probe head, and has a sliding slot formed thereon through which the slide rail can pass. The sliding rail assembly is made of a conductive material, and a cross-section area of the slide rail is greater than a cross-section area of the elastic material of the elastic element.

公开(公告)号：US20180080955A1

公开(公告)日：2018-03-22

申请号：US15437464

申请日：2017-02-21

Applicant: CHUNGHWA PRECISION TEST TECH. CO., LTD.

Inventor： Chih-Peng HSIEH

IPC: G01R1/067 ,  G01R31/28

CPC classification number: G01R1/06722 ,  G01R1/06733 ,  G01R31/2886

Abstract: A bolt type probe is provided, including a probe head having a bolt at one end thereof, a probe tail having a bolt hole corresponding to the bolt, an elastic element connected with the probe head and the probe tail. At least one portion of the bolt of the probe head is inserted in the bolt hole of the probe tail, and the bolt is moved relative to the bolt hole along with a movement of the elastic element.

公开(公告)号：US20180017593A1

公开(公告)日：2018-01-18

申请号：US15427083

申请日：2017-02-08

Applicant: CHUNGHWA PRECISION TEST TECH. CO., LTD.

Inventor： Wen Tsung LI ,  Kai Chieh HSIEH ,  Chih-Peng HSIEH

IPC: G01R1/067 ,  G01R31/28

CPC classification number: G01R1/06722 ,  G01R31/2886

Abstract: A probe structure is provided, including two probe heads for electrically contacting with the two objects, respectively, an elastic buffer portion forming a hollow space therein, a conductive portion being disposed within the hollow space and thereby being surrounded by the elastic buffer portion, and having two ends respectively electrically being connected to the two probe heads. When the two probe heads do not contact with the two objects electrically, the conductive portion is linearly extended between the two probe heads.