Invention Application
- Patent Title: FACILITATION OF SPIN-COAT PLANARIZATION OVER FEATURE TOPOGRAPHY DURING SUBSTRATE FABRICATION
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Application No.: US15724632Application Date: 2017-10-04
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Publication No.: US20180096905A1Publication Date: 2018-04-05
- Inventor: Ryan L. Burns , Benjamen M. Rathsack , Mark H. Somervell , Makoto Muramatsu
- Applicant: Tokyo Electron Limited
- Main IPC: H01L21/66
- IPC: H01L21/66 ; H01L21/3105 ; H01L21/02 ; G06F17/50

Abstract:
Described herein are technologies to facilitate device fabrication, especially those that involve spin-on coatings of a substrate (e.g., wafer). More particularly, technologies described herein facilitate the planarization (i.e., flatness) of spin-on coatings during the device fabrication to form a uniformly planar film or layer on the substrate. This abstract itself is not intended to limit the scope of this patent. The scope of the present invention is pointed out in the appending claims.
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