- 专利标题: METAL-ASSISTED ETCH COMBINED WITH REGULARIZING ETCH
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申请号: US15837322申请日: 2017-12-11
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公开(公告)号: US20180108791A1公开(公告)日: 2018-04-19
- 发明人: Joanne Yim , Jeffrey B. Miller , Michael Jura , Marcie R. Black , Joanne Forziati , Brian P. Murphy , Lauren Magliozzi
- 申请人: Advanced Silicon Group, Inc.
- 主分类号: H01L31/0236
- IPC分类号: H01L31/0236 ; H01L31/18 ; B82Y40/00 ; H01L21/306
摘要:
In an aspect of the disclosure, a process for forming nanostructuring on a silicon-containing substrate is provided. The process comprises (a) performing metal-assisted chemical etching on the substrate, (b) performing a clean, including partial or total removal of the metal used to assist the chemical etch, and (c) performing an isotropic or substantially isotropic chemical etch subsequently to the metal-assisted chemical etch of step (a). In an alternative aspect of the disclosure, the process comprises (a) performing metal-assisted chemical etching on the substrate, (b) cleaning the substrate, including removal of some or all of the assisting metal, and (c) performing a chemical etch which results in regularized openings in the silicon substrate.
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