Invention Application
- Patent Title: SELF ALIGNED INTERCONNECT STRUCTURES
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Application No.: US15875212Application Date: 2018-01-19
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Publication No.: US20180151504A1Publication Date: 2018-05-31
- Inventor: Xunyuan ZHANG , Roderick A. AUGUR , Hoon KIM
- Applicant: GLOBALFOUNDRIES INC.
- Main IPC: H01L23/532
- IPC: H01L23/532 ; H01L21/768 ; H01L23/528 ; H01L23/522

Abstract:
The present disclosure relates to semiconductor structures and, more particularly, to self-aligned interconnect structures and methods of manufacture. The structure includes an interconnect structure which is self-aligned with an upper level via metallization, and both the interconnect structure and the upper level via metallization are composed of a Pt group material.
Public/Granted literature
- US10199264B2 Self aligned interconnect structures Public/Granted day:2019-02-05
Information query
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