- 专利标题: Method and System for Thermal Imaging with Optical Emissions from a Device Under Test
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申请号: US15825025申请日: 2017-11-28
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公开(公告)号: US20180156673A1公开(公告)日: 2018-06-07
- 发明人: Dustin Kendig , Ali Shakouri , Hamid Piroozi , James Christofferson
- 申请人: Microsanj, LLC
- 申请人地址: US CA Santa Clara
- 专利权人: Microsanj, LLC
- 当前专利权人: Microsanj, LLC
- 当前专利权人地址: US CA Santa Clara
- 主分类号: G01K11/12
- IPC分类号: G01K11/12 ; H04N5/372 ; G06K9/62 ; H04N5/225
摘要:
A method for determining change in temperature of an electromagnetically radiating device between un-energized and energized states without contacting the device is disclosed. The method includes establishing a reference image form the device by illuminating the device with an optical signal having a first optical characteristic and capturing the reference image from the device in an un-energized state, establishing an on image form the device by illuminating the device in an energized state, and establishing a modified on image form the device by illuminating the device in the energized state with a modified optical signal having a third illuminating optical characteristic, and comparing the reference image, the on image, and the modified on image to establish changes in reflection as a result of changes in temperature of the device during energization.
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