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公开(公告)号：US10670475B2
公开(公告)日：2020-06-02
申请号：US15825025
申请日：2017-11-28
申请人： Microsanj, LLC
摘要： A method for determining change in temperature of an electromagnetically radiating device between un-energized and energized states without contacting the device is disclosed. The method includes establishing a reference image form the device by illuminating the device with an optical signal having a first optical characteristic and capturing the reference image from the device in an un-energized state, establishing an on image form the device by illuminating the device in an energized state, and establishing a modified on image form the device by illuminating the device in the energized state with a modified optical signal having a third illuminating optical characteristic, and comparing the reference image, the on image, and the modified on image to establish changes in reflection as a result of changes in temperature of the device during energization.
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公开(公告)号：US20180094979A1
公开(公告)日：2018-04-05
申请号：US15721980
申请日：2017-10-02
申请人： Microsanj, LLC
发明人： Dustin Kendig , Ali Shakouri , Hamid Piroozi
CPC分类号： G01J3/2823 , G01J3/10 , G01J3/32 , G01J5/0096 , G01J5/025 , G01J5/026 , G01J2005/0048 , G01J2005/0077 , G01N25/18 , H04N5/33 , H04N5/3651 , H04N17/002
摘要： A method for providing a high spatial resolution thermal imaging of an active electronic device. The method includes placing an electronic device on a testing stage of an imaging system. The method, calibrating the imaging system by determining thermoreflectance coefficient for a plurality of pixels forming thermal images, each pixel having a coordinate (x,y) captured from the electronic device at each of a plurality of wavelengths of illumination (CTRi(x,y,λi), activating the electronic device, and determining changes in reflection for each of the plurality of pixels at each of the plurality of wavelengths (ΔR/R), determining ΔR/R vs. CTRi(x,y,λi) for each of the plurality of pixels for each of the plurality of wavelengths, fitting ΔR/R vs. CTRi(x,y,λi) to a predetermined mathematical function and use the parameters to calculate the temperature at each pixel.
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公开(公告)号：US11067787B2
公开(公告)日：2021-07-20
申请号：US16658091
申请日：2019-10-20
申请人： Microsanj, LLC
摘要： An infrared (IR) digital lens (IR Objective) for an optical microscope is disclosed which includes a body, configured to be mounted to an objective interface of an optical microscope, an IR camera disposed in the body, the IR camera configured to receive light in the range of IR and capture images from a specimen disposed under the body without the need to move the specimen from the optical microscope.
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公开(公告)号：US10816401B2
公开(公告)日：2020-10-27
申请号：US15721980
申请日：2017-10-02
申请人： Microsanj, LLC
发明人： Dustin Kendig , Ali Shakouri , Hamid Piroozi
IPC分类号： G01J3/28 , G01N25/18 , G01J3/32 , G01J3/10 , H04N5/365 , H04N5/33 , G01J5/02 , G01J5/00 , H04N17/00
摘要： A method for providing a high spatial resolution thermal imaging of an active electronic device. The method includes placing an electronic device on a testing stage of an imaging system. The method, calibrating the imaging system by determining thermoreflectance coefficient for a plurality of pixels forming thermal images, each pixel having a coordinate (x,y) captured from the electronic device at each of a plurality of wavelengths of illumination (CTRi(x,y,λi), activating the electronic device, and determining changes in reflection for each of the plurality of pixels at each of the plurality of wavelengths (ΔR/R), determining ΔR/R vs. CTRi(x,y,λi) for each of the plurality of pixels for each of the plurality of wavelengths, fitting ΔR/R vs. CTRi(x,y,λi) to a predetermined mathematical function and use the parameters to calculate the temperature at each pixel.
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公开(公告)号：US10180359B2
公开(公告)日：2019-01-15
申请号：US15881757
申请日：2018-01-27
申请人： Microsanj, LLC
发明人： Dustin Kendig , Ali Shakouri , Hamid Piroozi
摘要： A method for determining change in temperature of different parts of an electronic or optoelectronic device between un-energized and energized states without contacting the device. The method includes establishing a reference image form an unexcited device by illuminating the device with an optical signal and capturing the reference image from the device in an un-energized state, illuminating the device with an optical signal during an energization pulse having a predetermined pulse width and pulse magnitude and capturing a plurality of on images from the device at different time delays, determining a transient temperature profile, calibrating the temperature profile for one or more regions of the device with unknown thermoreflectance coefficient based on the determined transient temperature profile for the one or more regions of the device with known thermoreflectance coefficient.
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公开(公告)号：US20180217004A1
公开(公告)日：2018-08-02
申请号：US15881757
申请日：2018-01-27
申请人： Microsanj, LLC
发明人： Dustin Kendig , Ali Shakouri , Hamid Piroozi
CPC分类号： G01J5/0859 , G01J5/0003 , G01J5/0096 , G01J5/0809 , G01J2005/0048 , G01J2005/0077 , G01J2005/0081 , G01N21/1717 , G01N25/18
摘要： A method for determining change in temperature of different parts of an electronic or optoelectronic device between un-energized and energized states without contacting the device. The method includes establishing a reference image form an unexcited device by illuminating the device with an optical signal and capturing the reference image from the device in an un-energized state, illuminating the device with an optical signal during an energization pulse having a predetermined pulse width and pulse magnitude and capturing a plurality of on images from the device at different time delays, determining a transient temperature profile, calibrating the temperature profile for one or more regions of the device with unknown thermoreflectance coefficient based on the determined transient temperature profile for the one or more regions of the device with known thermoreflectance coefficient.
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公开(公告)号：US20180156673A1
公开(公告)日：2018-06-07
申请号：US15825025
申请日：2017-11-28
申请人： Microsanj, LLC
CPC分类号： G01K11/125 , G06K9/6202 , H04N5/2256 , H04N5/30 , H04N5/372
摘要： A method for determining change in temperature of an electromagnetically radiating device between un-energized and energized states without contacting the device is disclosed. The method includes establishing a reference image form the device by illuminating the device with an optical signal having a first optical characteristic and capturing the reference image from the device in an un-energized state, establishing an on image form the device by illuminating the device in an energized state, and establishing a modified on image form the device by illuminating the device in the energized state with a modified optical signal having a third illuminating optical characteristic, and comparing the reference image, the on image, and the modified on image to establish changes in reflection as a result of changes in temperature of the device during energization.
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