Invention Application
- Patent Title: ANALYSIS METHOD AND ANALYZER
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Application No.: US15854281Application Date: 2017-12-26
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Publication No.: US20180180607A1Publication Date: 2018-06-28
- Inventor: Takuya KUBO
- Applicant: SYSMEX CORPORATION
- Priority: JP2016-256215 20161228
- Main IPC: G01N33/543
- IPC: G01N33/543 ; G01N35/00

Abstract:
Disclosed is an analysis method including: a component to be analyzed being set; bringing a carrier and a complex that includes the component into contact with each other, to form the complex on the carrier; selecting a washing process in accordance with the component; and analyzing the component, with use of the washing process selected in accordance with the set component.
Information query
IPC分类: