- 专利标题: METHOD AND SYSTEM FOR DETERMINING TEMPERATURE USING A MAGNETIC JUNCTION
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申请号: US16005595申请日: 2018-06-11
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公开(公告)号: US20180294024A1公开(公告)日: 2018-10-11
- 发明人: Sebastian Schafer , Dmytro Apalkov , Alexey Vasilyevitch Khvalkovskiy , Vladimir Nikitin , Robert Beach , Zheng Duan
- 申请人: Samsung Electronics Co., LTD.
- 主分类号: G11C11/16
- IPC分类号: G11C11/16 ; G11C7/04 ; G11C29/50 ; G01K7/36 ; G01R33/14 ; G01R33/09 ; G01K13/00
摘要:
A method for measuring a temperature of magnetic junction switchable using spin transfer. The magnetic junction includes at least one magnetic layer. The method includes measuring a temperature variation of at least one magnetic characteristic for the magnetic layer(s) versus temperature. The method also includes measuring a bias variation in the magnetic characteristic versus an electrical bias for the magnetic junction. This measurement is performed such that spin transfer torque-induced variation(s) in the magnetic characteristic(s) are accounted for. The temperature versus the electrical bias for the magnetic junction is determined based on the temperature variation and the bias variation.