Invention Application
- Patent Title: SEMICONDUCTOR MANUFACTURING METHOD
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Application No.: US16046787Application Date: 2018-07-26
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Publication No.: US20180346319A1Publication Date: 2018-12-06
- Inventor: CHUN-WEN CHENG , CHIA-HUA CHU , FEI-LUNG LAI , SHIANG-CHI LIN
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
- Main IPC: B81B7/00
- IPC: B81B7/00 ; B81C1/00 ; G01L9/00 ; G01N27/12

Abstract:
A method of manufacturing a semiconductor structure includes receiving a substrate, receiving a heater, receiving an electrode, and receiving a sensing material. The substrate have a first surface, a second surface opposite to the first surface and a plurality of vias extending from the second surface toward the first surface and filled with a conductive or semiconductive material and a first oxide layer, the first oxide layer surrounding the conductive or semiconductive material in the plurality of vias, and a second oxide layer disposed over the first surface and the second surface. The heater is disposed within a membrane over the first surface of the substrate and electrically connected with the substrate. The electrode is over the heater and the membrane; and the sensing material covers a portion of the electrode.
Information query