Invention Application
- Patent Title: MEASURING DEVICE
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Application No.: US16026759Application Date: 2018-07-03
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Publication No.: US20190011353A1Publication Date: 2019-01-10
- Inventor: Kazuki Setsuda , Naomichi Chida
- Applicant: YOKOGAWA ELECTRIC CORPORATION
- Applicant Address: JP Tokyo
- Assignee: YOKOGAWA ELECTRIC CORPORATION
- Current Assignee: YOKOGAWA ELECTRIC CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: JP2017-132960 20170706
- Main IPC: G01N21/25
- IPC: G01N21/25 ; G01N21/31

Abstract:
A measuring device includes: an irradiator that irradiates electromagnetic waves to an inspection object; a light collector having a reflecting surface that guides, to a light-collecting surface, electromagnetic waves whose incident angle with respect to an incident end facing the inspection object is within a predetermined angle, among the electromagnetic waves that have been transmitted through the inspection object; and a detector that detects the electromagnetic waves guided to the light-collecting surface. The measuring device measures a characteristic of the inspection object based on the detected electromagnetic waves.
Public/Granted literature
- US10481082B2 Measuring device Public/Granted day:2019-11-19
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