CANTILEVER AND MANUFACTURING METHOD FOR CANTILEVER
Abstract:
A cantilever used in a scanning probe microscope includes a supporting section, a lever section, and a protrusion section, which is a probe. A crystalline carbon composite layer including a crystalline carbon nanomaterial and a metal material, a melting point of which is 420° C. or lower, is deposited on a distal end portion of the protrusion section.
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