- 专利标题: PHASE CONTRAST X-RAY INTERFEROMETRY
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申请号: US16044111申请日: 2018-07-24
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公开(公告)号: US20190027265A1公开(公告)日: 2019-01-24
- 发明人: Joyoni Dey , Narayan Bhusal , Leslie Butler , Jonathan P. Dowling , Kyungmin Ham , Varshni Singh
- 申请人: Joyoni Dey , Narayan Bhusal , Leslie Butler , Jonathan P. Dowling , Kyungmin Ham , Varshni Singh
- 申请人地址: US LA Baton Rouge
- 专利权人: BOARD OF SUPERVISORS OF LOUISIANA STATE UNIVERSITY AND AGRICULTURAL AND MECHANICAL COLLEGE
- 当前专利权人: BOARD OF SUPERVISORS OF LOUISIANA STATE UNIVERSITY AND AGRICULTURAL AND MECHANICAL COLLEGE
- 当前专利权人地址: US LA Baton Rouge
- 主分类号: G21K1/06
- IPC分类号: G21K1/06 ; G01N23/041
摘要:
A phase contrast X-ray imaging system includes: an illumination source adapted to illuminate a region of interest; a diffraction grating adapted to receive illumination from the illuminated region of interest, the diffraction grating comprising a spatial structure having a first periodicity superimposed with a second periodicity that is different from the first periodicity; and a detector adapted to detect illumination passing through the diffraction grating, wherein the spatial structure is defined by varying height and/or pitch, and wherein the spatial structure imparts a first phase dependence based on the first periodicity and an additional phase dependence based on the second periodicity on the illumination passing through the diffraction grating.
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