PHASE CONTRAST X-RAY INTERFEROMETRY
    1.
    发明申请

    公开(公告)号:US20190027265A1

    公开(公告)日:2019-01-24

    申请号:US16044111

    申请日:2018-07-24

    IPC分类号: G21K1/06 G01N23/041

    摘要: A phase contrast X-ray imaging system includes: an illumination source adapted to illuminate a region of interest; a diffraction grating adapted to receive illumination from the illuminated region of interest, the diffraction grating comprising a spatial structure having a first periodicity superimposed with a second periodicity that is different from the first periodicity; and a detector adapted to detect illumination passing through the diffraction grating, wherein the spatial structure is defined by varying height and/or pitch, and wherein the spatial structure imparts a first phase dependence based on the first periodicity and an additional phase dependence based on the second periodicity on the illumination passing through the diffraction grating.

    PHASE CONTRAST X-RAY INTERFEROMETRY

    公开(公告)号:US20210065924A1

    公开(公告)日:2021-03-04

    申请号:US17097770

    申请日:2020-11-13

    IPC分类号: G21K1/06 G01N23/041

    摘要: A phase contrast X-ray imaging system includes: an illumination source adapted to illuminate a region of interest; a diffraction grating adapted to receive illumination from the illuminated region of interest, the diffraction grating comprising a spatial structure having a first periodicity superimposed with a second periodicity that is different from the first periodicity; and a detector adapted to detect illumination passing through the diffraction grating, wherein the spatial structure is defined by varying height and/or pitch, and wherein the spatial structure imparts a first phase dependence based on the first periodicity and an additional phase dependence based on the second periodicity on the illumination passing through the diffraction grating.