An aging test method for a light emitting device is provided. The aging test method includes: collecting, in an aging process applied to the light emitting device, an initial value of a first characteristic parameter of the light emitting device and an initial test time point; collecting a current value of the first characteristic parameter and a current test time point (step S1); generating a feature line according to the initial value, the current value, the initial test time point, and the current test time point, and calculating a slope of the feature line; determining whether the slope of the feature line is greater than or equal to a predetermined threshold and less than 0, and returning to the step S1 if a result of the determination is NO; and terminating the aging process applied to the light emitting device if the result of the determination is YES.