Invention Application
- Patent Title: WAFER PRODUCING METHOD
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Application No.: US16685393Application Date: 2019-11-15
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Publication No.: US20200156190A1Publication Date: 2020-05-21
- Inventor: Ryohei YAMAMOTO
- Applicant: DISCO CORPORATION
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@470db5e0
- Main IPC: B23K26/53
- IPC: B23K26/53 ; H01L29/16 ; B23K26/00

Abstract:
A wafer producing method for producing a wafer from an ingot, the ingot being previously formed with a separation layer along which the wafer is to be separated from the ingot. The wafer producing method includes a first ultrasonic vibration applying step of applying ultrasonic vibration to a given area of the ingot at a high density to thereby form a partially broken portion where a part of the separation layer is broken, a second ultrasonic vibration applying step of applying the ultrasonic vibration to the whole area of the ingot larger than the given area at a low density, after performing the first ultrasonic vibration applying step, thereby forming a fully broken portion where the separation layer is fully broken in such a manner that breaking starts from the partially broken portion, and a separating step of separating the wafer from the ingot along the fully broken portion.
Public/Granted literature
- US11446771B2 Method for producing wafers using ultrasound Public/Granted day:2022-09-20
Information query
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