Invention Application
- Patent Title: METHOD OF FORMING POLYSILICON FILM AND FILM FORMING APPARATUS
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Application No.: US16685627Application Date: 2019-11-15
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Publication No.: US20200161130A1Publication Date: 2020-05-21
- Inventor: Yutaka MOTOYAMA , Atsushi ENDO
- Applicant: TOKYO ELECTRON LIMITED
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@3e9579e3
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01L21/306 ; H01L21/67 ; C23C16/52 ; C23C16/24 ; C23C16/06

Abstract:
There is provided a method of forming a polysilicon film, which includes: forming an amorphous silicon film on a substrate; forming a cap layer, which is formed of an amorphous germanium film or an amorphous silicon germanium film, on the amorphous silicon film; forming crystal nuclei of a silicon in the amorphous silicon film by heating the substrate at a first temperature; removing the cap layer after the crystal nuclei are formed; and growing the crystal nuclei by heating the substrate from which the cap layer is removed, at a second temperature equal to or higher than the first temperature.
Public/Granted literature
- US11062904B2 Method of forming polysilicon film and film forming apparatus Public/Granted day:2021-07-13
Information query
IPC分类: