Invention Application
- Patent Title: INTEGRATED MIM DIODE
-
Application No.: US16668004Application Date: 2019-10-30
-
Publication No.: US20200168747A1Publication Date: 2020-05-28
- Inventor: Scott Robert Summerfelt , Benjamin Stassen Cook
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporation
- Current Assignee: Texas Instruments Incorporation
- Current Assignee Address: US TX Dallas
- Main IPC: H01L29/88
- IPC: H01L29/88 ; H01L23/522 ; H01L29/66

Abstract:
In an integrated circuit, a metal-insulator-metal (MIM) diode includes: a first metallization structure level having a first metal layer; a first dielectric layer over the first metal layer; a metal contact or via on the first metal layer and extending through a portion of the first dielectric layer; and a second metallization structure level having a second metal layer; and a second dielectric layer over the second metal layer. The diode has a first electrode on the metal contact or via, a multilayer dielectric structure on the first electrode, and a second electrode between the multilayer dielectric structure and the second metal layer.
Public/Granted literature
- US11049980B2 Integrated MIM diode Public/Granted day:2021-06-29
Information query
IPC分类: