Invention Application
- Patent Title: MASS ANALYZER
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Application No.: US16482731Application Date: 2018-04-04
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Publication No.: US20200227247A1Publication Date: 2020-07-16
- Inventor: Said BOUMSELLEK , Prakash Sreedhar MURTHY , Dave ANDERSON
- Applicant: ATONARP INC.
- Applicant Address: JP Minato-ku, Tokyo
- Assignee: ATONARP INC.
- Current Assignee: ATONARP INC.
- Current Assignee Address: JP Minato-ku, Tokyo
- International Application: PCT/JP2018/014441 WO 20180404
- Main IPC: H01J49/42
- IPC: H01J49/42 ; H01J49/00 ; G01N27/62

Abstract:
A mass analyzer for scanning sample gases is disclosed. The mass analyzer comprises an ionizer for generating ions from a sample; a mass filter with an accumulator section integrated in the mass filter and accumulates filtered ions prior to ejecting from the mass filter; and an ion detector that is configured to detecting ejected ions from the mass filter. The mass filter may include a quadrupole array and the accumulator section includes an ion trap array.
Public/Granted literature
- US10957527B2 Mass analyzer Public/Granted day:2021-03-23
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