公开(公告)号：US20190145930A1

公开(公告)日：2019-05-16

申请号：US16098018

申请日：2017-09-08

Applicant: ATONARP INC.

Inventor： Prakash Sreedhar MURTHY ,  Said BOUMSELLEK

IPC: G01N27/62 ,  G01N1/22 ,  F26B5/10

Abstract: There is provided a system including a monitoring unit that analyzes, using a sensor, components of a first gas which may include first components and a pre-separation unit disposed upstream of the monitoring unit. The pre-separation unit includes: a first supply line that supplies the first gas to the monitoring unit; a second supply line that supplies a second gas, which includes components obtained by removing the first components from the first gas using a first separator, to the monitoring unit; and an automatic valve station that periodically switches between the first supply line and the second supply line to alternately supply the first gas and the second gas to the monitoring unit.

公开(公告)号：US20220074890A1

公开(公告)日：2022-03-10

申请号：US17528306

申请日：2021-11-17

Applicant: ATONARP INC.

Inventor： Prakash Sreedhar MURTHY ,  Said BOUMSELLEK

IPC: G01N27/62 ,  F26B5/10 ,  G01N1/22 ,  G01N1/00

Abstract: There is provided a system (1) including a monitoring unit (50) that analyzes, using a sensor (51), components of a first gas which may include first components and a pre-separation unit (30) disposed upstream of the monitoring unit. The pre-separation unit includes: a first supply line (31) that supplies the first gas (35) to the monitoring unit; a second supply line (32) that supplies a second gas (36), which includes components obtained by removing the first components from the first gas using a first separator (40), to the monitoring unit; and an automatic valve station (38) that periodically switches between the first supply line and the second supply line to alternately supply the first gas and the second gas to the monitoring unit.

公开(公告)号：US20200227247A1

公开(公告)日：2020-07-16

申请号：US16482731

申请日：2018-04-04

Applicant: ATONARP INC.

Inventor： Said BOUMSELLEK ,  Prakash Sreedhar MURTHY ,  Dave ANDERSON

IPC: H01J49/42 ,  H01J49/00 ,  G01N27/62

Abstract: A mass analyzer for scanning sample gases is disclosed. The mass analyzer comprises an ionizer for generating ions from a sample; a mass filter with an accumulator section integrated in the mass filter and accumulates filtered ions prior to ejecting from the mass filter; and an ion detector that is configured to detecting ejected ions from the mass filter. The mass filter may include a quadrupole array and the accumulator section includes an ion trap array.