- 专利标题: MEASURING A NOISE LEVEL OF AN ACCELEROMETER
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申请号: US16824161申请日: 2020-03-19
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公开(公告)号: US20200300887A1公开(公告)日: 2020-09-24
- 发明人: Sriraman Dakshinamurthy , Matthew Julian Thompson , Vadim Tsinker
- 申请人: INVENSENSE, INC.
- 主分类号: G01P21/00
- IPC分类号: G01P21/00 ; G01P15/08 ; G01P15/125
摘要:
A method of measuring noise of an accelerometer can comprise exposing the accelerometer comprising a micro-electro-mechanical system (MEMS) component coupled to an application specific integrated circuit component (ASIC), to an external environmental input, with the MEMS component being configured to provide a first output to the ASIC based on the external environmental input. The method can further comprise estimating a first noise generated by operation of the MEMS component, and replacing the first output provided to the ASIC from the MEMS component, with a second output generated by a MEMS emulator component, with the second output comprising the first noise. Further, the method can include generating an output of the accelerometer based on the second output processed by the ASIC.
公开/授权文献
- US11255876B2 Measuring a noise level of an accelerometer 公开/授权日:2022-02-22
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