- 专利标题: PREEMPTIVE IDLE TIME READ SCANS
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申请号: US17035149申请日: 2020-09-28
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公开(公告)号: US20210027846A1公开(公告)日: 2021-01-28
- 发明人: Ashutosh Malshe , Harish Reddy Singidi , Kishore Kumar Muchherla , Michael G. Miller , Sampath Ratnam , Xu Zhang , Jie Zhou
- 申请人: Micron Technology, Inc.
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 主分类号: G11C16/26
- IPC分类号: G11C16/26 ; G06F11/10 ; G06F11/07 ; G06F11/22 ; G06F12/02 ; G11C7/06 ; G11C16/34
摘要:
Devices and techniques for initiating and controlling preemptive idle time read scans in a flash based storage system are disclosed. In an example, a memory device includes a NAND memory array and a memory controller to schedule and initiate read scans among multiple locations of the memory array, with such read scans being preemptively triggered during an idle (background) state of the memory device, thus reducing host latency during read and write operations in an active (foreground) state of the memory device. In an example, the optimization technique includes scheduling a read scan operation, monitoring an active or idle state of host IO operations, and preemptively initiating the read scan operation when entering an idle state, before the read scan operation is scheduled to occur. In further examples, the read scan may preemptively occur based on time-based scheduling, frequency-based conditions, or event-driven conditions triggering the read scan.
公开/授权文献
- US11250918B2 Preemptive idle time read scans 公开/授权日:2022-02-15
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