- 专利标题: MODULAR INSPECTION SYSTEM FOR MEASURING AN OBJECT
-
申请号: US16541774申请日: 2019-08-15
-
公开(公告)号: US20210048291A1公开(公告)日: 2021-02-18
- 发明人: Muhammad Umair Tahir , Oliver Zweigle , Mark Brenner , Michael Müller , Simon Raab , Steffen Kappes
- 申请人: FARO Technologies, Inc.
- 申请人地址: US FL Lake Mary
- 专利权人: FARO Technologies, Inc.
- 当前专利权人: FARO Technologies, Inc.
- 当前专利权人地址: US FL Lake Mary
- 主分类号: G01B11/25
- IPC分类号: G01B11/25
摘要:
Aspects of the present disclosure provide a system for measuring an object, the system including a plurality of frame segments. The frame segments are configured to mechanically couple together to form a frame. The plurality of frame segments includes a plurality of measurement device link segments and each of the plurality of measurement device link segments includes a measurement device which together form a plurality of measurement devices having a field of view within or adjacent to the frame. Each of the plurality of measurement devices is operable to measure three-dimensional (3D) coordinates for a plurality of points on the object. The system further includes a computing device to receive data from the plurality of measurement devices via a network established by the plurality of measurement device link segments.
公开/授权文献
- US11592285B2 Modular inspection system for measuring an object 公开/授权日:2023-02-28
信息查询