Invention Application
- Patent Title: PHASE CONTRAST X-RAY INTERFEROMETRY
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Application No.: US17097770Application Date: 2020-11-13
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Publication No.: US20210065924A1Publication Date: 2021-03-04
- Inventor: Joyoni Dey , Narayan Bhusal , Leslie Butler , Jonathan P. Dowling , Kyungmin Ham , Varshni Singh
- Applicant: Joyoni Dey , Narayan Bhusal , Leslie Butler , Jonathan P. Dowling , Kyungmin Ham , Varshni Singh
- Applicant Address: US LA Baton Rouge; US LA Baton Rouge; US LA Baton Rouge; US LA Baton Rouge; US LA Baton Rouge; US LA Baton Rouge
- Assignee: Joyoni Dey,Narayan Bhusal,Leslie Butler,Jonathan P. Dowling,Kyungmin Ham,Varshni Singh
- Current Assignee: Joyoni Dey,Narayan Bhusal,Leslie Butler,Jonathan P. Dowling,Kyungmin Ham,Varshni Singh
- Current Assignee Address: US LA Baton Rouge; US LA Baton Rouge; US LA Baton Rouge; US LA Baton Rouge; US LA Baton Rouge; US LA Baton Rouge
- Main IPC: G21K1/06
- IPC: G21K1/06 ; G01N23/041

Abstract:
A phase contrast X-ray imaging system includes: an illumination source adapted to illuminate a region of interest; a diffraction grating adapted to receive illumination from the illuminated region of interest, the diffraction grating comprising a spatial structure having a first periodicity superimposed with a second periodicity that is different from the first periodicity; and a detector adapted to detect illumination passing through the diffraction grating, wherein the spatial structure is defined by varying height and/or pitch, and wherein the spatial structure imparts a first phase dependence based on the first periodicity and an additional phase dependence based on the second periodicity on the illumination passing through the diffraction grating.
Public/Granted literature
- US11488740B2 Phase contrast X-ray interferometry Public/Granted day:2022-11-01
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