Invention Application
- Patent Title: FULL BIAS SENSING IN A MEMORY ARRAY
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Application No.: US17091580Application Date: 2020-11-06
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Publication No.: US20210125655A1Publication Date: 2021-04-29
- Inventor: Umberto Di Vincenzo , Ferdinando Bedeschi
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Main IPC: G11C11/22
- IPC: G11C11/22

Abstract:
Methods, systems, and apparatuses for full bias sensing in a memory array are described. Various embodiments of an access operation of a cell in a array may be timed to allow residual charge of a middle electrode between the cell and a selection component to discharge. Access operations may also be timed to allow residual charge of middle electrodes associated with other cells to be discharged. In conjunction with an access operation for a target cell, a residual charge of a middle electrode of another cell may be discharged, and the target cell may then be accessed. A capacitor in electronic communication with a cell may be charged and a logic state of the cell determined based on the charge of the capacitor. The timing for charging the capacitor may be related to the time for discharging a middle electrode of the cell or another cell.
Public/Granted literature
- US11232823B2 Full bias sensing in a memory array Public/Granted day:2022-01-25
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