- 专利标题: VERTICAL MEMORY DEVICES
-
申请号: US17113442申请日: 2020-12-07
-
公开(公告)号: US20210233870A1公开(公告)日: 2021-07-29
- 发明人: Yuhui HAN , Zhiliang XIA , Wenxi ZHOU
- 申请人: Yangtze Memory Technologies Co., Ltd.
- 申请人地址: CN Wuhan
- 专利权人: Yangtze Memory Technologies Co., Ltd.
- 当前专利权人: Yangtze Memory Technologies Co., Ltd.
- 当前专利权人地址: CN Wuhan
- 主分类号: H01L23/00
- IPC分类号: H01L23/00 ; H01L27/11519 ; H01L27/11556 ; H01L27/11565 ; H01L27/11582
摘要:
A semiconductor device includes a first stack of layers stacked on a substrate. The first stack of layers includes a source connection layer that is formed by replacing source sacrificial layers. The semiconductor device includes a channel structure that extends in the first stack of layers. The channel structure includes a channel layer that is in contact with the source connection layer in the first stack of layers. Further, the semiconductor device includes a shield structure formed in the first stack of layers. The shied structure encloses a stack of layers without the source connection layer.
公开/授权文献
- US11948894B2 Vertical memory devices 公开/授权日:2024-04-02
信息查询
IPC分类: