- 专利标题: WAFER-SCALE MEMORY TECHNIQUES
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申请号: US17162796申请日: 2021-01-29
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公开(公告)号: US20210240344A1公开(公告)日: 2021-08-05
- 发明人: Brent Keeth , Bambi L. DeLaRosa , Eiichi Nakano
- 申请人: Brent Keeth , Bambi L. DeLaRosa , Eiichi Nakano
- 申请人地址: US ID Boise; US TX Frisco; US ID Boise
- 专利权人: Brent Keeth,Bambi L. DeLaRosa,Eiichi Nakano
- 当前专利权人: Brent Keeth,Bambi L. DeLaRosa,Eiichi Nakano
- 当前专利权人地址: US ID Boise; US TX Frisco; US ID Boise
- 主分类号: G06F3/06
- IPC分类号: G06F3/06
摘要:
Techniques for wafer-scale memory device and systems are provided. In an example, a wafer-scale memory device can include a large single substrate, multiple memory circuit areas including dynamic random-access memory (DRAM), the multiple memory circuit areas integrated with the substrate and configured to form an array on the substrate, and multiple streets separating the memory circuit areas. The streets can accommodate attaching the substrate to a wafer-scale processor. In certain examples, the large, single substrate can have a major surface area of more than 20,000 square millimeters (mm2).
公开/授权文献
- US11621257B2 Wafer-scale memory techniques 公开/授权日:2023-04-04
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