Disclosed herein is an x-ray backscatter apparatus (“apparatus”) for non-destructive inspection of an object. The apparatus includes an x-ray emitter that includes a vacuum tube, an x-ray shield enclosed within the vacuum tube. The x-ray shield includes at least one emission aperture. The apparatus also includes a cathode enclosed within the vacuum tube and that is operable to generate an electron stream. Also included is an anode, enclosed within the vacuum tube and located relative to the cathode, to receive the electron stream and convert the electron stream from the cathode to an x-ray stream, and located relative to the emission aperture to direct at least a portion of the x-ray stream through the at least one emission aperture. Also disclosed are a system and a method that utilize the apparatus.