- 专利标题: EARLY CULLING FOR RAY TRACING
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申请号: US17008462申请日: 2020-08-31
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公开(公告)号: US20210407175A1公开(公告)日: 2021-12-30
- 发明人: Skyler Jonathon Saleh , Sagar S. Bhandare , Fataneh F. Ghodrat , Paul Raymond Vella
- 申请人: Advanced Micro Devices, Inc.
- 申请人地址: US CA Santa Clara
- 专利权人: Advanced Micro Devices, Inc.
- 当前专利权人: Advanced Micro Devices, Inc.
- 当前专利权人地址: US CA Santa Clara
- 主分类号: G06T15/06
- IPC分类号: G06T15/06 ; G06T15/40
摘要:
A technique for performing ray tracing operations is provided. The technique includes reading descendant-shared type metadata for a non-leaf node of a bounding volume hierarchy; identifying one or more culling types for a ray-intersection test for a ray; and determining whether to treat the non-leaf node as not intersected based on whether the one or more culling types includes at least one type specified by the descendant-shared type metadata.
公开/授权文献
- US11238640B2 Early culling for ray tracing 公开/授权日:2022-02-01
信息查询
IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06T | 一般的图像数据处理或产生 |
G06T15/00 | 3D〔三维〕图像的加工 |
G06T15/06 | .光线跟踪 |