• 专利标题: CAPACITANCE MEASUREMENT AND APPARATUS FOR RESISTIVE SWITCHING MEMORY DEVICES
  • 申请号: US16995718
    申请日: 2020-08-17
  • 公开(公告)号: US20220005527A1
    公开(公告)日: 2022-01-06
  • 发明人: Hagop NazarianCung Vu
  • 申请人: Crossbar, Inc.
  • 申请人地址: US CA Santa Clara
  • 专利权人: Crossbar, Inc.
  • 当前专利权人: Crossbar, Inc.
  • 当前专利权人地址: US CA Santa Clara
  • 主分类号: G11C13/00
  • IPC分类号: G11C13/00 G01R27/26
CAPACITANCE MEASUREMENT AND APPARATUS FOR RESISTIVE SWITCHING MEMORY DEVICES
摘要:
A semiconductor device includes two-terminal memory devices characterized by a range of program voltages and a first capacitance, wherein the two-terminal memory devices are coupled in parallel between ground and a first common node, a first capacitor having a second capacitance, coupled between ground and a second common node, a voltage source configured to provide an input voltage lower than the range of program voltages, a first operational amplifier including an inverting input, a non-inverting input, and an output, wherein the non-inverting input is coupled to the first voltage source, wherein the inverting input is coupled to a third common node, and wherein the output is coupled to a fourth common node, a first resistance device coupled between the third common node and the fourth common node, and wherein the first common node is coupled to the second common node and the third common node.
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