- 专利标题: SYSTEM AND METHOD FOR DATA INTEGRITY IN MEMORY SYSTEMS THAT INCLUDE QUASI-VOLATILE MEMORY CIRCUITS
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申请号: US17512449申请日: 2021-10-27
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公开(公告)号: US20220148670A1公开(公告)日: 2022-05-12
- 发明人: Frank Sai-keung Lee
- 申请人: SUNRISE MEMORY CORPORATION
- 申请人地址: US CA San Jose
- 专利权人: SUNRISE MEMORY CORPORATION
- 当前专利权人: SUNRISE MEMORY CORPORATION
- 当前专利权人地址: US CA San Jose
- 主分类号: G11C29/42
- IPC分类号: G11C29/42 ; G11C29/52 ; G11C29/12 ; G11C29/18
摘要:
A memory system includes: (a) a memory array including numerous quasi-volatile (“QV”) memory units each configured to store a first portion of a code word encoded using an error-detecting and error-correcting code (“ECC-encoded code word”); (b) a refresh circuit for reading and writing back the first portion of the ECC-encoded code word of a selected one of the QV memory unit; (c) a global parity evaluation circuit configured to determine a global parity of the ECC-encoded code word of the selected QV memory unit; and a memory controller configured for controlling operations carried out in the memory array, wherein when the global parity of the ECC-encoded code word of the selected QV memory unit is determined at the global parity evaluation circuit to be a predetermined parity, the memory controller (i) performs error correction on the selected ECC-encoded code word and (ii) causes the first portion of the corrected ECC-encoded code word to be written back to the selected QV memory unit, instead of the refresh circuit writing back the first portion of the ECC-encoded code word.
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