Invention Application
- Patent Title: SCANNING MICROSCOPE UNIT
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Application No.: US17442287Application Date: 2020-03-26
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Publication No.: US20220155576A1Publication Date: 2022-05-19
- Inventor: Jiro YAMASHITA , Yasuyuki TANABE , Shunsuke MATSUDA , Hirotoshi TERADA
- Applicant: HAMAMATSU PHOTONICS K.K.
- Applicant Address: JP Hamamatsu-shi, Shizuoka
- Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee Address: JP Hamamatsu-shi, Shizuoka
- Priority: JP2019-062987 20190328
- International Application: PCT/JP2020/013798 WO 20200326
- Main IPC: G02B21/00
- IPC: G02B21/00

Abstract:
Embodiments are for a confocal microscope unit attached to a connection port of a microscope including: light sources which output irradiation light to a sample to be observed; photodetectors which detect observation light generated from a sample in response to the irradiation light; a scan mirror which scans the irradiation light on the sample and guides the observation light generated from the sample to the photodetectors; a scan lens which guides the irradiation light scanned by the scan mirror to the microscope optical system and guides the observation light focused by the microscope optical system to the scan mirror; a lens barrel to which the scan lens is fixed; an attachment portion which attaches the lens barrel to the connection port; and a movable portion which supports the lens barrel so that an angle of the lens barrel with respect to the attachment portion is changeable.
Public/Granted literature
- US12216263B2 Scanning microscope unit Public/Granted day:2025-02-04
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