公开(公告)号：US20220155576A1

公开(公告)日：2022-05-19

申请号：US17442287

申请日：2020-03-26

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Jiro YAMASHITA ,  Yasuyuki TANABE ,  Shunsuke MATSUDA ,  Hirotoshi TERADA

IPC: G02B21/00

Abstract: Embodiments are for a confocal microscope unit attached to a connection port of a microscope including: light sources which output irradiation light to a sample to be observed; photodetectors which detect observation light generated from a sample in response to the irradiation light; a scan mirror which scans the irradiation light on the sample and guides the observation light generated from the sample to the photodetectors; a scan lens which guides the irradiation light scanned by the scan mirror to the microscope optical system and guides the observation light focused by the microscope optical system to the scan mirror; a lens barrel to which the scan lens is fixed; an attachment portion which attaches the lens barrel to the connection port; and a movable portion which supports the lens barrel so that an angle of the lens barrel with respect to the attachment portion is changeable.

公开(公告)号：US20240231067A9

公开(公告)日：2024-07-11

申请号：US18279098

申请日：2022-01-12

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Takashi MIHOYA ,  Yasuyuki TANABE ,  Shunsuke MATSUDA

IPC: G02B21/00

CPC classification number: G02B21/0048 ,  G02B21/008

Abstract: A scanning microscope unit includes: a light source for outputting irradiation light; a photodetector; a MEMS mirror for scanning an irradiation light over an observation object, and for guiding an observation light toward the photodetector; a scanning lens for guiding the irradiation light scanned by the MEMS mirror, to a microscope optical system, and for guiding the observation light imaged by the microscope optical system, to the MEMS mirror; and a frame member formed in a frame shape to define an opening, and disposed on a side of the microscope optical system with respect to the scanning lens such that the irradiation light and the observation light pass through the opening. The frame member includes a calibration portion provided in a side portion defining the opening, and for generating calibration light including a sensitivity wavelength of the photodetector in response to an incidence of the irradiation light.

公开(公告)号：US20240134177A1

公开(公告)日：2024-04-25

申请号：US18279098

申请日：2022-01-12

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Takashi MIHOYA ,  Yasuyuki TANABE ,  Shunsuke MATSUDA

IPC: G02B21/00

CPC classification number: G02B21/0048 ,  G02B21/008

Abstract: A scanning microscope unit includes: a light source for outputting irradiation light; a photodetector; a MEMS mirror for scanning an irradiation light over an observation object, and for guiding an observation light toward the photodetector; a scanning lens for guiding the irradiation light scanned by the MEMS mirror, to a microscope optical system, and for guiding the observation light imaged by the microscope optical system, to the MEMS mirror; and a frame member formed in a frame shape to define an opening, and disposed on a side of the microscope optical system with respect to the scanning lens such that the irradiation light and the observation light pass through the opening. The frame member includes a calibration portion provided in a side portion defining the opening, and for generating calibration light including a sensitivity wavelength of the photodetector in response to an incidence of the irradiation light.

公开(公告)号：US20220179185A1

公开(公告)日：2022-06-09

申请号：US17442163

申请日：2020-03-26

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Jiro YAMASHITA ,  Yasuyuki TANABE ,  Shunsuke MATSUDA ,  Hirotoshi TERADA

IPC: G02B21/16 ,  G02B21/00 ,  G02B26/08 ,  G01N21/64

Abstract: A confocal microscope unit according to an embodiment includes: a first subunit which includes a light source, a pinhole plate, and a photodetector; a second subunit which includes a light source, a pinhole plate, and a photodetector; a scan mirror which scans excitation light output from the first and second subunits on a sample via a microscope optical system and guides fluorescence generated from the sample in response to the excitation light and focused by the microscope optical system to the first and second subunits; and a main housing which is attachable to a connection port and to which the scan mirror, the first subunit, and the second subunit are fixed, wherein the first subunit and the second subunit are disposed in the main housing so that incident angles of two excitation lights to the scan mirror are displaced from each other by a predetermined angle.

公开(公告)号：US20220155577A1

公开(公告)日：2022-05-19

申请号：US17442238

申请日：2020-03-26

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Jiro YAMASHITA ,  Yasuyuki TANABE ,  Shunsuke MATSUDA ,  Hirotoshi TERADA

IPC: G02B21/00 ,  G02B27/14 ,  G02B26/08 ,  G01N21/64

Abstract: A confocal microscope unit according to an embodiment includes: a first subunit which includes a light source, a pinhole plate, and a photodetector; a second subunit which includes a light source, a pinhole plate, and a photodetector; a scan mirror which scans excitation light on a sample and guides fluorescence generated from the sample to the first and second subunits; a scan lens which guides the excitation light and guides the fluorescence to the scan mirror; and a main housing which is attachable to a connection port and to which the scan mirror, the scan lens, and the subunits are fixed, wherein the first subunit includes a dichroic mirror that separates the excitation light and fluorescence handled by the own unit from those handled by the second subunit.

公开(公告)号：US20200271511A1

公开(公告)日：2020-08-27

申请号：US16316100

申请日：2017-05-12

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Kengo SUZUKI ,  Kazuya IGUCHI ,  Yasuyuki TANABE

IPC: G01J1/04 ,  G01J1/16 ,  G01J3/02

Abstract: An optical measuring device includes an integrator formed with an incident opening on which excitation light is to be incident and an exit opening from which measurement light is to exit, a light guide unit for guiding the measurement light that exits from the exit opening, and a light detecting unit for detecting the measurement light guided by the light guide unit. The light guide unit includes a plurality of light guide members arranged so that incident end surfaces of the light guide members face the inside of the integrator through the exit opening. The light detecting unit detects the measurement light that is guided by at least one of the plurality of light guide members. Light-receiving regions of the plurality of light guide members on the incident end surface side overlap with each other in the integrator.