Invention Application
- Patent Title: A SEMICONDUCTOR DEVICE AND A METHOD FOR MANUFACTURING THE SEMICONDUCTOR DEVICE
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Application No.: US17432123Application Date: 2020-02-27
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Publication No.: US20220157992A1Publication Date: 2022-05-19
- Inventor: Yuichi YANAGISAWA , Hisao IKEDA , Tsutomu MURAKAWA
- Applicant: Semiconductor Energy Laboratory Co., Ltd.
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Priority: JP2019-044538 20190312
- International Application: PCT/IB2020/051663 WO 20200227
- Main IPC: H01L29/786
- IPC: H01L29/786 ; H01L29/417

Abstract:
A semiconductor device with high productivity is provided. The semiconductor device includes a first and a second transistor and a first and a second capacitor. The first and the second transistor include gate electrodes and back gate electrodes. The second transistor is provided in a layer above the first transistor, and the second capacitor is provided in a layer above the first capacitor. One electrode of the first capacitor is electrically connected to one of a source electrode and a drain electrode of the first transistor and electrically connected to one of a source electrode and a drain electrode of the second transistor. The other electrode of the first capacitor is formed in the same layer as the back gate electrode of the second transistor.
Public/Granted literature
- US11830951B2 Semiconductor device including transistor and capacitor Public/Granted day:2023-11-28
Information query
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