Invention Application
- Patent Title: SYSTEMS, METHODS, AND DEVICES FOR HIGH-SPEED INPUT/OUTPUT MARGIN TESTING
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Application No.: US17534409Application Date: 2021-11-23
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Publication No.: US20220163588A1Publication Date: 2022-05-26
- Inventor: Daniel S. Froelich , Sam J. Strickling
- Applicant: Tektronix, Inc.
- Applicant Address: US OR Beaverton
- Assignee: Tektronix, Inc.
- Current Assignee: Tektronix, Inc.
- Current Assignee Address: US OR Beaverton
- Main IPC: G01R31/3183
- IPC: G01R31/3183 ; G01R31/3181 ; G01R31/3185
Abstract:
A margin testing device includes at least one interface structured to connect to a device under test (DUT) one or more controllers structured to create a set of test signals based on a sequence of pseudo random data and one or more pre-defined parameters, and an output structured to send the set of test signals to the DUT. Methods and a system for testing a DUT with the disclosed margin tester and other testing device are also described.
Public/Granted literature
- US12055584B2 Systems, methods, and devices for high-speed input/output margin testing Public/Granted day:2024-08-06
Information query
IPC分类:
