Invention Application
- Patent Title: ULTRAVIOLET RADIATION ACTIVATED ATOMIC LAYER DEPOSITION
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Application No.: US17646103Application Date: 2021-12-27
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Publication No.: US20220199403A1Publication Date: 2022-06-23
- Inventor: Christine Y. OUYANG , Ziwei FANG
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Main IPC: H01L21/02
- IPC: H01L21/02 ; C23C16/02 ; C23C16/455 ; H01L21/768 ; H01L21/8234 ; H01L21/285

Abstract:
The present disclosure relates to a method of fabricating a semiconductor structure, the method includes forming an opening and depositing a metal layer in the opening. The depositing includes performing one or more deposition cycles, wherein each deposition cycle includes flowing a first precursor into a deposition chamber and performing an ultraviolet (UV) radiation process on the first precursor. The method further includes performing a first purging process in the deposition chamber to remove at least a portion of the first precursor, flowing a second precursor into the deposition chamber, and purging the deposition chamber to remove at least a portion of the second precursor.
Information query
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