• Patent Title: PROCESS CHAMBER HAVING A TEMPERATURE MEASURING UNIT AND APPARATUS FOR PROCESSING A SUBSTRATE HAVING A TEMPERATURE MEASURING UNIT
  • Application No.: US17456180
    Application Date: 2021-11-23
  • Publication No.: US20220208526A1
    Publication Date: 2022-06-30
  • Inventor: Doosoon KIMSangmin MUN
  • Applicant: Semes Co., Ltd.
  • Applicant Address: KR Cheonan-si
  • Assignee: Semes Co., Ltd.
  • Current Assignee: Semes Co., Ltd.
  • Current Assignee Address: KR Cheonan-si
  • Priority: KR10-2020-0187431 20201230
  • Main IPC: H01J37/32
  • IPC: H01J37/32
PROCESS CHAMBER HAVING A TEMPERATURE MEASURING UNIT AND APPARATUS FOR PROCESSING A SUBSTRATE HAVING A TEMPERATURE MEASURING UNIT
Abstract:
An apparatus for processing a substrate may include an upper electrode, a gas distributing unit disposed under the upper electrode, a shower head disposed under the gas distributing unit, a temperature measuring unit including a first temperature sensor for measuring a temperature of the shower head, and a lower electrode disposed under the shower head. The first temperature sensor may pass through the upper electrode and the lower electrode and may make directly contact with the shower head.
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