Invention Application
- Patent Title: PROCESS CHAMBER HAVING A TEMPERATURE MEASURING UNIT AND APPARATUS FOR PROCESSING A SUBSTRATE HAVING A TEMPERATURE MEASURING UNIT
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Application No.: US17456180Application Date: 2021-11-23
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Publication No.: US20220208526A1Publication Date: 2022-06-30
- Inventor: Doosoon KIM , Sangmin MUN
- Applicant: Semes Co., Ltd.
- Applicant Address: KR Cheonan-si
- Assignee: Semes Co., Ltd.
- Current Assignee: Semes Co., Ltd.
- Current Assignee Address: KR Cheonan-si
- Priority: KR10-2020-0187431 20201230
- Main IPC: H01J37/32
- IPC: H01J37/32

Abstract:
An apparatus for processing a substrate may include an upper electrode, a gas distributing unit disposed under the upper electrode, a shower head disposed under the gas distributing unit, a temperature measuring unit including a first temperature sensor for measuring a temperature of the shower head, and a lower electrode disposed under the shower head. The first temperature sensor may pass through the upper electrode and the lower electrode and may make directly contact with the shower head.
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