Invention Application
- Patent Title: Managing Open Blocks in Memory Systems
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Application No.: US17730548Application Date: 2022-04-27
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Publication No.: US20220253352A1Publication Date: 2022-08-11
- Inventor: Yi-Chun Liu , Wei Jie Chen , Ching Ting Lu , Zheng Wu
- Applicant: Macronix International Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Macronix International Co., Ltd.
- Current Assignee: Macronix International Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Main IPC: G06F11/10
- IPC: G06F11/10 ; G06F11/07 ; G06F11/30 ; G11C16/08 ; G06F12/0882 ; G11C16/34 ; G11C16/14 ; G06F12/02

Abstract:
Systems, methods, and apparatus including computer-readable mediums for managing open blocks in memory systems such as NAND flash memory devices are provided. In one aspect, a method includes: evaluating a read disturbance level of an open block in a memory, the open block having one or more programmed word lines and one or more blank word lines, and in response to determining that the read disturbance level of the open block is beyond a threshold level, managing each memory cell in at least one of the blank word lines to have a smaller data storing capacity than each memory cell in at least one of the one or more programmed word lines so as to reduce impact of read disturbance.
Public/Granted literature
- US11656934B2 Managing open blocks in memory systems Public/Granted day:2023-05-23
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