- 专利标题: GERMANIUM MEDIATED DE-OXIDATION OF SILICON
-
申请号: US17692977申请日: 2022-03-11
-
公开(公告)号: US20220270874A1公开(公告)日: 2022-08-25
- 发明人: Yong Liang , Vimal Kumar Kamineni
- 申请人: Psiquantum, Corp.
- 申请人地址: US CA Palo Alto
- 专利权人: Psiquantum, Corp.
- 当前专利权人: Psiquantum, Corp.
- 当前专利权人地址: US CA Palo Alto
- 主分类号: H01L21/02
- IPC分类号: H01L21/02 ; H01L21/28
摘要:
A method for removing a native oxide film from a semiconductor substrate includes repetitively depositing layers of germanium on the native oxide and heating the substrate causing the layer of germanium to form germanium oxide, desorbing a portion of the native oxide film. The process is repeated until the oxide film is removed. A subsequent layer of strontium titanate can be deposited on the semiconductor substrate, over either residual germanium or a deposited germanium layer. The germanium can be converted to silicon germanium oxide by exposing the strontium titanate to oxygen.
公开/授权文献
- US11651956B2 Germanium mediated de-oxidation of silicon 公开/授权日:2023-05-16
信息查询
IPC分类: