Invention Application
- Patent Title: DISTANCE MEASURING DEVICE, ELECTRONIC EQUIPMENT, AND METHOD FOR MANUFACTURING DISTANCE MEASURING DEVICE
-
Application No.: US17631970Application Date: 2020-07-02
-
Publication No.: US20220276344A1Publication Date: 2022-09-01
- Inventor: Hirohisa YASUKAWA , Masayuki NAGAO
- Applicant: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Applicant Address: JP Kanagawa
- Assignee: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Current Assignee: SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Current Assignee Address: JP Kanagawa
- Priority: JP2019-150228 20190820
- International Application: PCT/JP2020/025939 WO 20200702
- Main IPC: G01S7/481
- IPC: G01S7/481 ; G01S17/89

Abstract:
A device includes a first substrate (903), a second substrate (100) on the first substrate (903), and a light emitting device (11) including a light source (300) on the second substrate (100) and that emits light toward an object. The light emitting device includes a driver (200) disposed in the second substrate (100) and that drives the light source (300). A portion of the driver (200) overlaps a first portion of the light source (300) in a plan view. The device includes an imaging device (12) on the first substrate adjacent to the light emitting device (11) and that senses light reflected from the object. The light-emitting device (11) reduces the wiring inductance by electrically connecting the light source (300) and the driver (200) via the connecting via (101). Further, the second substrate (100) includes a thermal via (102) for heat radiation. Considering that a certain number of thermal vias (102) are arranged immediately below the light source (300), the amount of overlap is desirably 50% or less. An upper surface surrounded by side wall (600) is covered by a diffuser plate (700). A light-receiving element (910) may be directly mounted as a bare chip on the substrate (903) by using an epoxy or silicone die attach material. The light source (300) preferably includes a semiconductor laser.
Information query