Invention Application
- Patent Title: GROWN BAD BLOCK MANAGEMENT IN A MEMORY SUB-SYSTEM
-
Application No.: US17747598Application Date: 2022-05-18
-
Publication No.: US20220277802A1Publication Date: 2022-09-01
- Inventor: Tao Liu , Chun Sum Yeung , Xiangang Luo
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C29/52 ; G11C29/44

Abstract:
A replacement block pool for a memory device is established. The replacement block pool comprises one or more valid blocks from a set of valid blocks in the memory device determined based on a constraint defining a minimum number of valid blocks for the memory device. A grown bad block is detected in the memory device. The grown bad block is replaced with a replacement block from the replacement block pool in response to detecting the grown bad block.
Public/Granted literature
- US11728006B2 Grown bad block management in a memory sub-system Public/Granted day:2023-08-15
Information query