- 专利标题: PACKAGE STRUCTURE AND MANUFACTURING METHOD THEREOF
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申请号: US17199348申请日: 2021-03-11
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公开(公告)号: US20220293505A1公开(公告)日: 2022-09-15
- 发明人: Sung-Yueh Wu , Chien-Ling Hwang , Jen-Chun Liao , Ching-Hua Hsieh , Pei-Hsuan Lee , Chia-Hung Liu
- 申请人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 申请人地址: TW Hsinchu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsinchu
- 主分类号: H01L23/498
- IPC分类号: H01L23/498 ; H01L23/31 ; H01L21/48
摘要:
A package structure includes a carrier substrate, a die, and a first redistribution structure. The carrier substrate has a first surface and a second surface opposite to the first surface. The carrier substrate includes an insulating body and through carrier vias (TCV) embedded in the insulating body. The die is disposed over the firs surface of the carrier substrate. The die is electrically connected to the TCVs. The first redistribution structure is disposed on the second surface of the carrier substrate.
公开/授权文献
- US11756872B2 Package structure and manufacturing method thereof 公开/授权日:2023-09-12
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