Invention Application
- Patent Title: MEMORY STRUCTURE WITH DOPING-INDUCED LEAKAGE PATHS
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Application No.: US17833419Application Date: 2022-06-06
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Publication No.: US20220301646A1Publication Date: 2022-09-22
- Inventor: Hsin-Wen Su , Shih-Hao Lin , Jui-Lin Chen , Lien-Jung Hung , Ping-Wei Wang
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Main IPC: G11C17/16
- IPC: G11C17/16 ; H01L27/112 ; H01L29/06 ; H01L21/265

Abstract:
The present disclosure provides semiconductor device and methods of forming the same. A semiconductor device according to the present disclosure includes a gate structure, a source/drain feature adjacent the gate structure, a dielectric layer disclosed over the gate structure and the source/drain feature, a gate contact disposed in the dielectric layer and over the gate structure, and a source/drain contact disposed in the dielectric layer and over the source/drain feature. The dielectric layer is doped with a dopant and the dopant includes germanium or tin.
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