- 专利标题: SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THE SAME
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申请号: US17859247申请日: 2022-07-07
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公开(公告)号: US20220344345A1公开(公告)日: 2022-10-27
- 发明人: Yanghee Lee , Jonghyuk Park , Ilyoung Yoon , Boun Yoon , Heesook Cheon
- 申请人: Samsung Electronics Co., Ltd.
- 申请人地址: KR Suwon-si
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-si
- 优先权: KR10-2019-0136634 20191030
- 主分类号: H01L27/108
- IPC分类号: H01L27/108
摘要:
A semiconductor device includes a substrate including first and second region, a bit line structure on the first region, key structures on the second region, each key structure having an upper surface substantially coplanar with an upper surface of the bit line structure, a first trench disposed between two adjacent key structures spaced apart from each other in a first direction, a filling pattern in a lower portion of the first trench, the filling pattern having a flat upper surface and including a first conductive material, and a first conductive structure on the flat upper surface of the filling pattern, an upper sidewall of the first trench, and the upper surface of each of the plurality of key structures, the first conductive structure including a second conductive material.
公开/授权文献
- US11910594B2 Semiconductor devices and methods of manufacturing the same 公开/授权日:2024-02-20
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