Invention Application
- Patent Title: Phase-Change Memory Device and Method
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Application No.: US17867460Application Date: 2022-07-18
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Publication No.: US20220352465A1Publication Date: 2022-11-03
- Inventor: Tung Ying Lee , Shao-Ming Yu , Yu Chao Lin
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Main IPC: H01L45/00
- IPC: H01L45/00 ; H01L27/24

Abstract:
In an embodiment, a device includes: a first metallization layer over a substrate, the substrate including active devices; a first bit line over the first metallization layer, the first bit line connected to first interconnects of the first metallization layer, the first bit line extending in a first direction, the first direction parallel to gates of the active devices; a first phase-change random access memory (PCRAM) cell over the first bit line; a word line over the first PCRAM cell, the word line extending in a second direction, the second direction perpendicular to the gates of the active devices; and a second metallization layer over the word line, the word line connected to second interconnects of the second metallization layer.
Public/Granted literature
- US11997933B2 Phase-change memory device and method Public/Granted day:2024-05-28
Information query
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