Invention Application
- Patent Title: MAGNETIC PROPERTY MEASURING APPARATUS AND MAGNETIC PROPERTY MEASURING METHOD
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Application No.: US17804659Application Date: 2022-05-31
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Publication No.: US20220381738A1Publication Date: 2022-12-01
- Inventor: Lei ZHANG , Fumito KUDO , Yuki HIRAI , Masayuki MAKITA , Kensuke YAMANAKA
- Applicant: SHOWA DENKO K.K.
- Applicant Address: JP Tokyo
- Assignee: SHOWA DENKO K.K.
- Current Assignee: SHOWA DENKO K.K.
- Current Assignee Address: JP Tokyo
- Priority: JP2021-092117 20210601
- Main IPC: G01N27/72
- IPC: G01N27/72 ; G01N1/44

Abstract:
A magnetic property measuring apparatus measures magnetic properties of a magnetic recording medium, and includes a rotating mechanism which rotates the magnetic recording medium, a heating or cooling mechanism which heats or cools the magnetic recording medium; a temperature measuring mechanism which measures a temperature of the magnetic recording medium, a laser heating mechanism, disposed opposite to a measurement site of the magnetic recording medium, which heats the measurement site without making contact with the measurement site, a magnetic write part, disposed opposite to the measurement site, which magnetizes the measurement site without making contact with the measurement site, and a magnetic read part, disposed opposite to the measurement site, which reads a magnetic flux leakage at the measurement site without making contact with the measurement site.
Public/Granted literature
- US11846605B2 Magnetic property measuring apparatus and magnetic property measuring method Public/Granted day:2023-12-19
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