公开(公告)号：US20220381738A1

公开(公告)日：2022-12-01

申请号：US17804659

申请日：2022-05-31

Applicant: SHOWA DENKO K.K.

Inventor： Lei ZHANG ,  Fumito KUDO ,  Yuki HIRAI ,  Masayuki MAKITA ,  Kensuke YAMANAKA

IPC: G01N27/72 ,  G01N1/44

Abstract: A magnetic property measuring apparatus measures magnetic properties of a magnetic recording medium, and includes a rotating mechanism which rotates the magnetic recording medium, a heating or cooling mechanism which heats or cools the magnetic recording medium; a temperature measuring mechanism which measures a temperature of the magnetic recording medium, a laser heating mechanism, disposed opposite to a measurement site of the magnetic recording medium, which heats the measurement site without making contact with the measurement site, a magnetic write part, disposed opposite to the measurement site, which magnetizes the measurement site without making contact with the measurement site, and a magnetic read part, disposed opposite to the measurement site, which reads a magnetic flux leakage at the measurement site without making contact with the measurement site.