- 专利标题： DISTRIBUTED COMPUTING SYSTEM FOR PRODUCT DEFECT ANALYSIS
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申请号： US17043960申请日： 2019-12-20
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公开(公告)号： US20230153974A1公开(公告)日： 2023-05-18
- 发明人: Zhaoyue LI , Dong CHAI , Yaoping WANG , Meijuan ZHANG , Hong WANG
- 申请人： BOE TECHNOLOGY GROUP CO., LTD.
- 申请人地址： CN Beijing
- 专利权人： BOE TECHNOLOGY GROUP CO., LTD.
- 当前专利权人： BOE TECHNOLOGY GROUP CO., LTD.
- 当前专利权人地址： CN Beijing
- 国际申请： PCT/CN2019/127071 2019.12.20
- 进入国家日期： 2020-09-30
- 主分类号： G06T7/00
- IPC分类号： G06T7/00 ; G05B19/418
摘要：
A distributed computing system for product defect analysis is disclosed. The distributed computing system for product defect analysis includes a computing cluster for processing product manufacturing messages, a computing cluster for identifying product defect, a product image database, and a client device.
公开/授权文献
- US11880968B2 Distributed computing system for product defect analysis 公开/授权日：2024-01-23
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