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公开(公告)号:US20240004375A1
公开(公告)日:2024-01-04
申请号:US18253961
申请日:2021-04-30
Inventor: Yu WANG , Haijin WANG , Wangqiang HE , Dong CHAI , Yiming LEI , Hong WANG , Jianmin WU
IPC: G05B19/418
CPC classification number: G05B19/41875 , G05B2219/32368
Abstract: A data processing method, comprising: acquiring a production record corresponding to each sample of a plurality of samples, the production record including process information, a production time corresponding to the process information, and an index value; determining a high-incidence time period of defects according to index values and production times corresponding to the process information in acquired production records of a plurality of samples; determining an influence degree of the process information on sudden defect according to the high-incidence time period of defects and the acquired production records.
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公开(公告)号:US20230048386A1
公开(公告)日:2023-02-16
申请号:US17978384
申请日:2022-11-01
Inventor: Yaoping WANG , Zhaoyue LI , Haodong YANG , Meijuan ZHANG , Dong CHAI , Hong WANG
IPC: G06V10/776 , G06T7/00 , G06V10/774 , G06V10/70 , G06V10/94 , G06V10/764
Abstract: The present disclosure provides a method and device for detecting an image category. The method includes: acquiring a sample data set including a plurality of sample images labeled with a category, the sample data set including a training data set and a verification data set; training a deep learning model using the training data set to obtain, according to different numbers of training rounds, at least two trained models; testing the at least two trained models using the verification data set to generate a verification test result; generating, based on the verification test result, a verification test index; determining, according to the verification test index, a target model from the at least two trained models; and predict a to-be-tested image of the target object using the target model to obtain the category of the to-be-tested image.
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公开(公告)号:US20210364999A1
公开(公告)日:2021-11-25
申请号:US16972402
申请日:2019-11-29
Applicant: BOE TECHNOLOGY GROUP CO., LTD.
IPC: G05B19/406 , G06F3/147 , G06N20/00
Abstract: A system for analyzing cause of product defect, including: a distributed storage device configured to store production data generated by a factory device; an analysis device including one or more processors configured to perform: acquiring a production record from the production data; the production record includes information of processing devices used during production procedures for producing the products and information of defects occurring, where each product is processed by multiple processing devices, and each processing device participates in only the production procedures of a portion of the products; determining a correlation weight of the processing device to be analyzed corresponding to a defect to be analyzed according to the production record, and determining a correlation between the processing device to be analyzed and the defect to be analyzed according to the correlation weight; a display device configured to display an analysis result of the analysis device.
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4.
公开(公告)号:US20230401692A1
公开(公告)日:2023-12-14
申请号:US18033774
申请日:2020-10-30
Applicant: BOE Technology Group Co., Ltd.
Inventor: Wangqiang HE , Yiwen DING , Yuanyuan LU , Dong CHAI , Hong WANG
CPC classification number: G06T7/0008 , G06T7/001 , G06T7/12 , G06T7/62 , G09G3/006 , G06T2207/30121
Abstract: A method and apparatus for measuring the actual area of a defect, and a method and apparatus for testing a display panel. The method for measuring the actual area of a defect includes: acquiring a measurement image of a display panel, wherein the measurement image has a defect region; according to the measurement image, determining the area of defect pixels of the defect in the measurement image and determining the size of reference object pixels of a reference object in the measurement image; and according to the area of the defect pixels, the size of the reference object pixels and the actual size of the reference object, determining the actual area of the defect in the display panel.
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公开(公告)号:US20230153974A1
公开(公告)日:2023-05-18
申请号:US17043960
申请日:2019-12-20
Applicant: BOE TECHNOLOGY GROUP CO., LTD.
Inventor: Zhaoyue LI , Dong CHAI , Yaoping WANG , Meijuan ZHANG , Hong WANG
IPC: G06T7/00 , G05B19/418
CPC classification number: G06T7/0004 , G05B19/41875 , G06T2207/20084 , G06T2207/30148 , G06T2207/20081 , G05B2219/32368
Abstract: A distributed computing system for product defect analysis is disclosed. The distributed computing system for product defect analysis includes a computing cluster for processing product manufacturing messages, a computing cluster for identifying product defect, a product image database, and a client device.
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公开(公告)号:US20220092359A1
公开(公告)日:2022-03-24
申请号:US17477070
申请日:2021-09-16
Applicant: BOE TECHNOLOGY GROUP CO., LTD.
Inventor: Libo ZHANG , Yuanyuan LU , Wangqiang HE , Dong CHAI , Hong WANG
Abstract: The present disclosure relates to an image data classification method, device and system, and relates to the field of computer technology. The method includes: inputting test image data into a neural network model trained by using an original training sample set for classification, and determining an image type to which the test image data belongs and a membership probability of the image data belonging to the image type; establishing an easy-to-classify data set, according to test image data with a membership probability greater than a first threshold; adding test image data in the easy-to-classify data set that has a classification accuracy rate less than or equal to a second threshold and a correct classification result to the original training sample set to generate an augmented training sample set; and using the augmented training sample set to train the neural network model so as to determine an image class
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7.
公开(公告)号:US20240119584A1
公开(公告)日:2024-04-11
申请号:US18543121
申请日:2023-12-18
Applicant: BOE TECHNOLOGY GROUP CO., LTD.
Inventor: Yongzhang LIU , Zhaoyue LI , Dong CHAI , Hong WANG
IPC: G06T7/00 , G06V10/764 , G06V10/82
CPC classification number: G06T7/001 , G06V10/764 , G06V10/82 , G01N29/4445 , G06T2207/20081 , G06T2207/20084 , G06T2207/30121
Abstract: The present disclosure provides a detection method. The detection method includes inputting an image to be detected into a detection model being pre-constructed and detecting the image to be detected. The detection model includes a defect classification identification sub-model configured to identify a classification of a defect in the image to be detected, and the defect classification identification sub-model comprises a plurality of base models and a secondary model. The present disclosure further provides an electronic device and a non-transitory computer-readable storage medium.
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公开(公告)号:US20220317644A1
公开(公告)日:2022-10-06
申请号:US17431790
申请日:2020-02-28
Applicant: BOE TECHNOLOGY GROUP CO., LTD.
Inventor: Weihe LIU , Dong CHAI , Haohan WU , Guoliang SHEN , Tian LAN
IPC: G05B19/042
Abstract: The present disclosure provides a production programming system based on a nonlinear program model, including: a distributed storage device and an analysis device, wherein the analysis device includes a processor configured to obtain production record information; construct the nonlinear program model based on the production record information; and solve the nonlinear program model to obtain first feasible solutions. The nonlinear program model includes a constraint condition that satisfies process requirements and an objective function indicating pressure equilibrium across the same device set, and each of the first feasible solutions is configured to indicate a production program. The present disclosure further provides a production programming method and a computer-readable storage medium which can improve efficiency and reduce device idleness rate.
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公开(公告)号:US20220138899A1
公开(公告)日:2022-05-05
申请号:US17490754
申请日:2021-09-30
Inventor: Xiaohui ZHAO , Wangqiang HE , Libo ZHANG , Dong CHAI , Hong WANG
Abstract: The present disclosure relates to methods and apparatuses for processing an image, training an image recognition network and recognizing an image. The method of processing an image includes: obtaining a plurality of original images from an original image set, where at least one of the plurality of original images includes an annotation area; obtaining at least one first image by splicing the plurality of original images; for each of the at least one first image, adjusting a shape and/or size of the first image based on the plurality of original images to form a second image; obtaining respective positions of the at least one annotation area in the second image by converting respective positions of the at least one annotation area in the plurality of original images.
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公开(公告)号:US20210209488A1
公开(公告)日:2021-07-08
申请号:US17044276
申请日:2019-12-20
Applicant: BOE TECHNOLOGY GROUP CO., LTD.
Inventor: Zhaoyue LI , Dong CHAI , Yuanyuan LU , Hong WANG
Abstract: An inference computing apparatus comprises at least one processor and a memory with program instructions stored therein, the program instructions can be executed by the at least one processor to cause the inference computing apparatus to perform the following operations: receiving a first inference model from a model training apparatus, the first inference model being obtained through a model training by the model training apparatus based on a first training sample library, the first training sample library comprising training samples from historical data generated in a manufacturing stage; performing an inference computing on data to be processed generated in the manufacturing stage based on the first inference model to obtain the inference result which is sent to a user-side device; and evaluating performance of the first inference model to determine whether the first inference model needs to be updated, and if yes, updating the first inference model.
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