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公开(公告)号：US20230048386A1
公开(公告)日：2023-02-16
申请号：US17978384
申请日：2022-11-01
Inventor： Yaoping WANG , Zhaoyue LI , Haodong YANG , Meijuan ZHANG , Dong CHAI , Hong WANG
IPC: G06V10/776 , G06T7/00 , G06V10/774 , G06V10/70 , G06V10/94 , G06V10/764
Abstract: The present disclosure provides a method and device for detecting an image category. The method includes: acquiring a sample data set including a plurality of sample images labeled with a category, the sample data set including a training data set and a verification data set; training a deep learning model using the training data set to obtain, according to different numbers of training rounds, at least two trained models; testing the at least two trained models using the verification data set to generate a verification test result; generating, based on the verification test result, a verification test index; determining, according to the verification test index, a target model from the at least two trained models; and predict a to-be-tested image of the target object using the target model to obtain the category of the to-be-tested image.
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2.发明公开公开(公告)号：US20230142383A1
公开(公告)日：2023-05-11
申请号：US17044160
申请日：2019-12-20
Applicant: BOE TECHNOLOGY GROUP CO., LTD.
Inventor： Meijuan ZHANG , Yaoping WANG , Zhaoyue LI , Yuanyuan LU , Dong CHAI , Hong WANG
IPC: G01N21/88 , G06Q10/0639
CPC classification number: G01N21/8851 , G06Q10/06395 , G01N2021/8887
Abstract: A method and a device for processing product manufacturing messages, and an electronic device are disclosed. The method for processing product manufacturing messages includes: monitoring a plurality of product manufacturing messages; establishing a product defect analysis task queue based on the plurality of product manufacturing messages; distributing product defect analysis tasks to product manufacturing assisting devices based on the product defect analysis task queue, wherein the product defect analysis tasks include a task of identifying product defect content based on a defect identification model; wherein the product defect content includes any one or more of: product defect type, product defect location, and product defect size.
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公开(公告)号：US20220343481A1
公开(公告)日：2022-10-27
申请号：US17417487
申请日：2020-05-29
Applicant: BOE TECHNOLOGY GROUP CO., LTD.
Inventor： Yongzhang LIU , Zhaoyue LI , Dong CHAI , Hong WANG
IPC: G06T7/00 , G06V10/82 , G06V10/764
Abstract: The present disclosure provides a detection device of a display panel. The detection device includes: an image receiver configured to receive a detection image of a display panel to be detected; a detector configured to input the detection image of the display panel to be detected into a detection model and generate a detection result by the detection model, the detection model is pre-constructed and configured to detect the display panel. The disclosure also provides a detection method of the display panel, an electronic device and a computer readable medium.
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4.发明公开公开(公告)号：US20240119584A1
公开(公告)日：2024-04-11
申请号：US18543121
申请日：2023-12-18
Applicant: BOE TECHNOLOGY GROUP CO., LTD.
Inventor： Yongzhang LIU , Zhaoyue LI , Dong CHAI , Hong WANG
IPC: G06T7/00 , G06V10/764 , G06V10/82
CPC classification number: G06T7/001 , G06V10/764 , G06V10/82 , G01N29/4445 , G06T2207/20081 , G06T2207/20084 , G06T2207/30121
Abstract: The present disclosure provides a detection method. The detection method includes inputting an image to be detected into a detection model being pre-constructed and detecting the image to be detected. The detection model includes a defect classification identification sub-model configured to identify a classification of a defect in the image to be detected, and the defect classification identification sub-model comprises a plurality of base models and a secondary model. The present disclosure further provides an electronic device and a non-transitory computer-readable storage medium.
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公开(公告)号：US20210209488A1
公开(公告)日：2021-07-08
申请号：US17044276
申请日：2019-12-20
Applicant: BOE TECHNOLOGY GROUP CO., LTD.
Inventor： Zhaoyue LI , Dong CHAI , Yuanyuan LU , Hong WANG
Abstract: An inference computing apparatus comprises at least one processor and a memory with program instructions stored therein, the program instructions can be executed by the at least one processor to cause the inference computing apparatus to perform the following operations: receiving a first inference model from a model training apparatus, the first inference model being obtained through a model training by the model training apparatus based on a first training sample library, the first training sample library comprising training samples from historical data generated in a manufacturing stage; performing an inference computing on data to be processed generated in the manufacturing stage based on the first inference model to obtain the inference result which is sent to a user-side device; and evaluating performance of the first inference model to determine whether the first inference model needs to be updated, and if yes, updating the first inference model.
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Patent Agency Ranking
公开(公告)号：US20230153974A1
公开(公告)日：2023-05-18
申请号：US17043960
申请日：2019-12-20
Applicant: BOE TECHNOLOGY GROUP CO., LTD.
Inventor： Zhaoyue LI , Dong CHAI , Yaoping WANG , Meijuan ZHANG , Hong WANG
IPC: G06T7/00 , G05B19/418
CPC classification number: G06T7/0004 , G05B19/41875 , G06T2207/20084 , G06T2207/30148 , G06T2207/20081 , G05B2219/32368
Abstract: A distributed computing system for product defect analysis is disclosed. The distributed computing system for product defect analysis includes a computing cluster for processing product manufacturing messages, a computing cluster for identifying product defect, a product image database, and a client device.
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公开(公告)号：US20210166060A1
公开(公告)日：2021-06-03
申请号：US16633400
申请日：2019-05-23
Applicant: BOE TECHNOLOGY GROUP CO., LTD.
Inventor： Hong WANG , Zhaoyue LI
Abstract: The application provides an image detection method, an image detection apparatus, and a patterning control method, the image detection method including: identifying an input image to obtain image feature data of the input image; comparing the image feature data with preset image feature data in a preset image feature database to obtain deviation data of the input image; wherein the input image is a pattern image of a patterned structure. By intelligently detecting the pattern image of the patterned structure, the accuracy of the detection is improved, thereby reducing the labor input cost.
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8.发明公开公开(公告)号：US20240304034A1
公开(公告)日：2024-09-12
申请号：US18666299
申请日：2024-05-16
Applicant: BOE TECHNOLOGY GROUP CO., LTD.
Inventor： Meijuan ZHANG , Yaoping WANG , Zhaoyue LI , Yuanyuan LU , Dong CHAI , Hong WANG
IPC: G07C3/14 , B29C45/76 , G01N21/88 , G06F11/36 , G06F18/2451 , G06Q10/0639 , G06T7/00 , H01L21/67
CPC classification number: G07C3/14 , B29C45/76 , G01N21/8851 , G06F11/3688 , G06F18/2451 , G06Q10/06395 , G06T7/001 , H01L21/67288 , G01N2021/8887
Abstract: A method and a device for processing product manufacturing messages, and an electronic device are disclosed. The method for processing product manufacturing messages includes: monitoring a plurality of product manufacturing messages; establishing a product defect analysis task queue based on the plurality of product manufacturing messages; distributing product defect analysis tasks to product manufacturing assisting devices based on the product defect analysis task queue, wherein the product defect analysis tasks include a task of identifying product defect content based on a defect identification model; wherein the product defect content includes any one or more of: product defect type, product defect location, and product defect size.
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公开(公告)号：US20230206420A1
公开(公告)日：2023-06-29
申请号：US17764707
申请日：2021-01-28
Inventor： Yaoping WANG, Sr. , Zhaoyue LI , Haodong YANG , Meijuan ZHANG , Dong CHAI , Hong WANG
IPC: G06T7/00
CPC classification number: G06T7/001 , G06T2207/20084 , G06T2207/20081
Abstract: A method and device for detecting a defect and method for training a model are provided. The method for detecting the defect includes: acquiring a sample data set and identifying feature information of the sample data set; acquiring an initial model; configuring a training parameter based on the feature information; obtaining a target model by training, according to the training parameter, the initial model with the sample data set; and obtaining defect information of a product by inputting real data of the product into the target model. The training parameter includes at least one of a learning rate descent strategy, a total number of training rounds and a test strategy, the learning rate descent strategy includes a number of learning rate descents and a round number when a learning rate descends, and the test strategy includes a number of tests and a round number when testing.
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公开(公告)号：US20230030296A1
公开(公告)日：2023-02-02
申请号：US17429013
申请日：2020-10-30
Inventor： Meijuan ZHANG , Yaoping WANG , Zhaoyue LI , Yuanyuan LU , Wangqiang HE , Dong CHAI , Hong WANG
Abstract: The present disclosure relates to a task processing method and device based on defect detection, a computer readable storage medium, and a task processing apparatus . The method includes receiving a detection task; determining a task type of the detection task; storing the detection task in a task queue if the task type is a target task type; and executing the detection task in a preset order and generating a feedback signal when a processor is idle. The detection task of the target task type includes an inference task and a training task. Executing the training task includes modifying configuration information according to a preset rule based on product information in the detection task; acquiring training data and an initial model according to the product information; and using the training data to train the initial model according to the configuration information to obtain a target model and store it in memory.
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